| 번호 | 품명 | 모델 | 제조회사 | 가능여부 |
|---|---|---|---|---|
| 14146 | XY RECORDER | WX3000 | GRAPHTEC | 가능(사내교정) |
| 14147 | XY RECORDER | WX4000 | GRAPHTEC | 가능(사내교정) |
| 14148 | XRF-THICKNESS STANDARD | Cr 0.455 μm | HITACHI HIGH-TECH | 불가능(사내교정) |
| 14149 | XRF-THICKNESS STANDARD | Cu 4.96 μm | HITACHI HIGH-TECH | 불가능(사내교정) |
| 14150 | XRF-THICKNESS STANDARD | Cu 2.175 μm | HITACHI HIGH-TECH | 불가능(사내교정) |
| 14151 | XRF-THICKNESS STANDARD | Cr 0.257 μm | HITACHI HIGH-TECH | 불가능(사내교정) |
| 14152 | XRF 분석기 | EDX-GP | SHIMADZU | 불가능(사내교정) |
| 14153 | XRF THICKNESS STANDARD | NI 3.07 μm | CALMETRICS | 불가능(사내교정) |
| 14154 | XRF THICKNESS STANDARD | Ni 3.81 μm | OXFORD | 불가능(사내교정) |
| 14155 | XRF THICKNESS STANDARD | NI 3.84 μm | OXFORD | 불가능(사내교정) |
| 14156 | XRF THICKNESS STANDARD | GOLD 0.25 um | OXFORD | 불가능(사내교정) |
| 14157 | XRF THICKNESS STANDARD | GOLD 0.60 μm | OXFORD | 불가능(사내교정) |
| 14158 | XRF THICKNESS STANDARD | GOLD 0.63 um | OXFORD | 불가능(사내교정) |
| 14159 | XRF THICKNESS STANDARD | Au 0.274 μm | CALMETRICS | 불가능(사내교정) |
| 14160 | XRF THICKNESS STANDARD | Au 0.407 μm | SII | 불가능(사내교정) |