| 번호 | 품명 | 모델 | 제조회사 | 가능여부 |
|---|---|---|---|---|
| 14161 | Z HITESTER | 3531 | HIOKI | 가능(사내교정) |
| 14162 | YEASTEN MOISTURE METER | YL-1 | KAO SHIANG | 가능(사내교정) |
| 14163 | Y/C PAL SIGNAL GENERATOR | TSG121 | TEKTRONIX | 가능(사내교정) |
| 14164 | XY RECORDER | WX3000 | GRAPHTEC | 가능(사내교정) |
| 14165 | XY RECORDER | WX4000 | GRAPHTEC | 가능(사내교정) |
| 14166 | XRF-THICKNESS STANDARD | Cr 0.455 μm | HITACHI HIGH-TECH | 불가능(사내교정) |
| 14167 | XRF-THICKNESS STANDARD | Cu 4.96 μm | HITACHI HIGH-TECH | 불가능(사내교정) |
| 14168 | XRF-THICKNESS STANDARD | Cu 2.175 μm | HITACHI HIGH-TECH | 불가능(사내교정) |
| 14169 | XRF-THICKNESS STANDARD | Cr 0.257 μm | HITACHI HIGH-TECH | 불가능(사내교정) |
| 14170 | XRF 분석기 | EDX-GP | SHIMADZU | 불가능(사내교정) |
| 14171 | XRF THICKNESS STANDARD | NI 3.07 μm | CALMETRICS | 불가능(사내교정) |
| 14172 | XRF THICKNESS STANDARD | Ni 3.81 μm | OXFORD | 불가능(사내교정) |
| 14173 | XRF THICKNESS STANDARD | NI 3.84 μm | OXFORD | 불가능(사내교정) |
| 14174 | XRF THICKNESS STANDARD | GOLD 0.25 um | OXFORD | 불가능(사내교정) |
| 14175 | XRF THICKNESS STANDARD | GOLD 0.60 μm | OXFORD | 불가능(사내교정) |